MSE 6720

Advanced X-ray Characterization

Course Description

Course information provided by the Courses of Study 2022-2023.

Graduate-level introduction to coherent x-ray scattering and imaging in the context of nanoscale phenomena in metals, ceramics, polymers, and composites. The course focuses on in-situ x-ray characterization of functional materials through using the ability of novel x-ray sources to generate laser-like x-ray beams. Novel sources include recently build or upgraded x-ray synchrotrons (e.g., CHESS), table-top soft x-ray lasers, and x-ray free-electron lasers. Specific topics include coherence of x-ray beams, coherent x-ray imaging, x-ray cross correlation spectroscopy, resonant x-ray diffraction, in-situ x-ray characterization, ultrafast x-ray measurements, and the overview of existing x-ray sources and x-ray focusing techniques.

When Offered Spring.

Permission Note Enrollment limited to: graduate students or permission of instructor.
Prerequisites/Corequisites Prerequisite: understanding of crystal structure and basic diffraction at the level of MSE 2060 or permission by instructor.

View Enrollment Information