ORIE 5750

ORIE 5750

Course information provided by the Courses of Study 2017-2018.

Learn and apply key concepts of modeling, analysis and validation from machine learning, data mining and signal processing to analyze and extract meaning from data. Implement algorithms and perform experiments on images, text, audio and mobile sensor measurements. Gain working knowledge of supervised and unsupervised techniques including classification, regression, clustering, feature selection, and dimensionality reduction.

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  •   Regular Academic Session.  Combined with: CS 5785ECE 5414

  • 3 Credits Stdnt Opt

  • 18549 ORIE 5750   LEC 030

  • Taught in NYC. Enrollment limited to Cornell Tech students.