ECE 4570
Last Updated
- Schedule of Classes - January 14, 2015 6:16PM EST
- Course Catalog - January 14, 2015 6:21PM EST
Classes
ECE 4570
Course Description
Course information provided by the Courses of Study 2014-2015.
Teaches fundamental principles on semiconductor carrier statistics, band diagrams, pn-junction diodes, heterojunctions, Schottky diodes, BJT, MOS capacitor and MOSFET. Emphasis is put on the MOSFET designs for advanced VLSI technology from its physical structure, accurate modeling, manufacturability and applications. Device designs include short channel effects, gatestack alternatives, band engineering, and strain engineering. By using computer simulation and experimental data, the course culminates in a design project dealing with technical concerns in current VLSI industry. The goal for this course is to train circuit, device, and process engineers for semiconductor technology research and development.
When Offered Fall.
Prerequisites/Corequisites Prerequisite: ECE 3150 and ECE 3030 or MSE 2620 or AEP 4500.
Outcomes
- Obtain a basic understanding of semiconductor device operation.
- Learn the operation of semiconductor test equipment including on wafer probing techniques. Carry out basic automated measurement sequences.
- Apply device fundamentals to effectively predict the measured behavior of the device under test.
- Develop comprehensive experimental and analytical skills leading to effective communication of results.
Regular Academic Session. Choose one lecture and one laboratory.
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Credits and Grading Basis
4 Credits Graded(Graded)
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Class Number & Section Details
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Meeting Pattern
- MWF Phillips Hall 213
Instructors
Shealy, J
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Additional Information
Instruction Mode:
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Class Number & Section Details
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Meeting Pattern
- M Phillips Hall 236
Instructors
Shealy, J
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Additional Information
Instruction Mode:
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Class Number & Section Details
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Meeting Pattern
- W Phillips Hall 236
Instructors
Shealy, J
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Additional Information
Instruction Mode:
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